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Method for determining the chemical composition of a powder

Référence

05296-01

Statut des brevets

French priority patent application n° FR1259101 filed on September 27, 2012 and entitled «  Méthode et système de détection et/ou d’analyse de particules dans un plasma froid. »

Inventeurs

Laifa BOUFENDI
Gaëtan WATTIEAUX
Christophe DUTOUQUET
Emeric FREJAFON

Statut commercial

Exclusive or non-exclusive license

Laboratoire

Description

CONTEXT

Chemical characterisation of nano-particles is generally ex-situ using conventional chemical characterization techniques such as XPS, LIBS (Laser Induced Breakdown Spectroscopy)…

This method provides in-situ and real-time chemical characterisation of nano-particles in dry environments.

TECHNICAL DESCRIPTION

This characterization technique consists on using LIBS to measure the chemical composition of trapped nano-particles in radio frequency plasma.

In other words, trapped nano-particles in the plasma are irradiated by highly energetic pulsed laser to cause partial evaporation and create local plasma. The emitted radiation from this local plasma contains the chemical signature of nano-particles.

From this chemical signature information such as the chemical composition and stoichiometry could be measured. Furthermore, Size and morphology could be deduced.

DEVELOPMENT STAGE

The laboratory can provide a demonstration of the performance of this method.
Based on the same invention, a more simple, stable and sensitive method is currently under development.

BENEFITS

This invention allows in-situ chemical analyses of nano-particles. It can be easily installed in a production line for the process control/analyses.
This control has the advantage to be:

  • in-situ
  • real time
  • not intrusive and
  • dry environments

INDUSTRIAL APPLICATIONS

This invention could be used for:

  • production process control of nano-particle by giving its chemical composition, stoichiometry, size and morphology,
  • nano-particle or bacterial detection in production environments and
  • nano-particle detection in case of leak or contamination.
For further information, please contact us (Ref 05296-01)

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  • Ce champ n’est utilisé qu’à des fins de validation et devrait rester inchangé.
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